Estimating the Quality of Thermionic Cathodes for Microwave Vacuum Tubes Using the Low-Frequency Noise Parameters

Authors

  • Михаил [Mikhail] Дмитриевич [D.] Воробьев [Vorobyev]
  • Дмитрий [Dmitriy] Николаевич [N.] Юдаев [Yudaev]
  • Андрей [Andrey] Юрьевич [Yu.] Зорин [Zorin]

DOI:

https://doi.org/10.24160/1993-6982-2018-5-120-127

Keywords:

thermionic cathode, cathode image, low-frequency noise, defects

Abstract

It is proposed to estimate the quality of thermionic cathode emitting surface in microwave vacuum tubes from the level and shape of low- frequency noise spectral characteristics. The proposed concept is based on the idea about the noise generation mechanism caused by migrating flow of activating atoms over the surface of weakly emitting defects. The noise is generated due to work function fluctuations caused by a randomly changing number of activating atoms on the defect surface. The cathode emitting surface contains both emission centers with a low work function (the current from them is taken predominantly when the noise is significantly damped by spatial charge) and low-emitting areas with an increased work function, which are in saturated state when there is no spatial charge. The latter ones make the predominant contribution to the noise and perform the role of emission defects. A procedure for preprocessing the measured noise spectral characteristics has been developed, which involves smoothing and averaging by means of median filtering and cubic spline interpolation algorithms. The procedure also includes subsequent decomposition into separate components using the previously modeled base components for defects of different sizes. The decomposition technique has been implemented as a computer program based on a synthesis of spectral characteristics by summation of base components in various combinations. For a group of similar dispenser cathodes made of W-Re sponge impregnated with Ba compounds and coated with a thin Os film, the quantitative content of defects as a function of their dimensions — so-called cathode images — has been determined. The found defect areas increase with the operating time and are proportional to the square of cathode currents. It is shown that a larger defect area obtained from the noise spectral characteristics before long-term tests corresponds to more significant degradation of cathode emission parameters after the test. Thus, the measurement of low-frequency noise and processing the results after comprehensive experimental confirmation on large batches of cathodes can be regarded as a tool for predicting and evaluating the reliability of vacuum tubes.

Author Biographies

Михаил [Mikhail] Дмитриевич [D.] Воробьев [Vorobyev]

Science degree:

Dr.Sci. (Techn.)

Workplace

Electronics and Nanoelectronics Dept., NRU MPEI

Occupation

Professor

Дмитрий [Dmitriy] Николаевич [N.] Юдаев [Yudaev]

Workplace

Electronics and Nanoelectronics Dept., NRU MPEI

Occupation

Leading Engineer

Андрей [Andrey] Юрьевич [Yu.] Зорин [Zorin]

Science degree:

Ph.D. (Techn.)

Workplace

Electronics and Nanoelectronics Dept., NRU MPEI

Occupation

Professor

References

1. Кислицын А.П. Контроль эмиссионной неоднородности рабочей поверхности термокатода в процессе эмиссионных испытаний // Авиационно-космическая техника и технология. 2015. № 4 (121). C. 90—95.

2. Vandamme L.K.J. Noise as a Diagnostic Tool for Quality and Reliability of Electronic Devices // IEEE Trans. Electron Devices. 1994. V. 41. No. 11. Pp. 2176—2187.

3. Шитов Е.М. Программно-аппаратный комплекс для шумовой диагностики термоэлектронных катодов электровакуумных приборов: автореф. дис. ... канд.техн. наук. Рязань, 2014.

4. Маковийчук М.И. Фликкер-шумовая спектроскопия. Структурно-неупорядоченные полупроводники. Саарбрюккен (Германия): Lap Lambert Academic Publ., 2013.

5. Ван дер Зил А. Флуктуационные явления в полупроводниках. М.: Изд-во иностр. лит-ры, 1961.

6. Hasker J.A.M., Van Dorst P. Pitfalls in the Evaluation of Cathode Properties from I–V Characteristics // IEEE Trans. on Electron Devices. 1989. V. 36. No. 1. Pp. 201—208.

7. Дюбуа Б.Ч., Култашев О.К., Поливникова О.В. Эмиссионная электроника, нанотехнология, синергетика (к истории идей в катодной технологии) // Электронная техника. Cерия «СВЧ-техника». 2008. Вып. 4 (497). C. 3—22.

8. Van Vliet K.M., Chenette E.R. Noise Spectra Resulting from Diffusion Processes in a Cylindrical Geometry // Physica. 1965. V. 31. Iss.7. Pp. 985—1001.

9. Воробьев М.Д., Юдаев Д.Н. Шумовая диагностика термокатодов в составе электронно-лучевой пушки // Прикладная физика. 2010. № 5. С. 60—65.

10. Cortenraad R. Surface Analysis of Thermionic Dispenser Cathodes. Eindhoven: Techn. Un-t Eindhoven, 2000.

11. Воробьев М.Д., Юдаев Д.Н., Зорин А.Ю., Чудин В.Г. Низкочастотные шумы термоэлектронных катодов как источник информации о состоянии эмитирующей поверхности // Вакуумная наука и техника: Материалы XXII науч.-техн. конф. с участием зарубежных специалистов. Феодосия, 2015. С. 266—269.

12. Воробьев М.Д., Кумов Я.С., Юдаев Д.Н. Создание образа поверхности с эмиссионными дефектами на основе измерения низкочастотных шумов отбираемого тока // Современные технологии в науке и образовании: Сб. трудов Междунар. науч.-техн. и науч.- метод. конф. 2017. Т. 1. С. 266—269.
---
Для цитирования: Воробьев М.Д., Юдаев Д.Н., Зорин А.Ю. Оценка качества термоэлектронных катодов сверхвысокочастотных электровакуумных приборов с использованием характеристик низкочастотного шума // Вестник МЭИ. 2018. № 5. С. 120—127. DOI: 10.24160/1993-6982-2018-5-120-127.
#
1. Kislicyn A.P. Kontrol' Emissionnoy Neodnorodnosti Rabochey Poverkhnosti Termokatoda v Processe Emissionnykh Ispytaniy. Aviacionno-kosmicheskaya Tekhnika i Tekhnologiya. 2015;4 (121):90—95. (in Russian).

2. Vandamme L.K.J. Noise as a Diagnostic Tool for Quality and Reliability of Electronic Devices. IEEE Trans. Electron Devices. 1994;41;11:2176—2187.

3. Shitov E.M. Programmno-apparatnyy Kompleks dlya Shumovoy Diagnostiki Termoelektronnykh Katodov Elektrovakuumnykh Priborov: Avtoref. Dis. ... Kand. Tekhn. Nauk. Ryazan', 2014. (in Russian).

4. Makoviychuk M.I. Flikker-shumovaya Spektroskopiya. Strukturno-neuporyadochennye Poluprovodniki. Saarbryukken (Germaniya): Lap Lambert Academic Publ., 2013. (in Russian).

5. Van der Zil A. Fluktuacionnye Yavleniya v Poluprovodnikakh. M.: Izd-vo Inostr. Lit-ry, 1961. (in Russian).

6. Hasker J.A.M., Van Dorst P. Pitfalls in the Evaluation of Cathode Properties from I–V Characteristics. IEEE Trans. on Electron Devices. 1989;36;1:201—208.

7. Dyubua B.Ch., Kultashev O.K., Polivnikova O.V. Emissionnaya Elektronika, Nanotekhnologiya, Sinergetika (k Istorii Idey v Katodnoy Tekhnologii). Elektronnaya Tekhnika. Ceriya «SVCH-tekhnika». 2008;4 (497):3—22. (in Russian).

8. Van Vliet K.M., Chenette E.R. Noise Spectra Resulting from Diffusion Processes in a Cylindrical Geometry. Physica. 1965;31;7: 985—1001.

9. Vorob'ev M.D., Yudaev D.N. Shumovaya Diagnostika Termokatodov v Sostave Elektronno-luchevoy Pushki. Prikladnaya Fizika. 2010;5:60—65. (in Russian).

10. Cortenraad R. Surface Analysis of Thermionic Dispenser Cathodes. Eindhoven: Techn. Un-t Eindhoven, 2000.

11. Vorob'ev M.D., Yudaev D.N., Zorin A.Yu., Chudin V.G. Nizkochastotnye Shumy Termoelektronnykh Katodov kak Istochnik Informacii o Sostoyanii Emitiruyushhey Poverkhnosti. Vakuumnaya Nauka i Tekhnika: Materialy XXII Nauch.-tekhn. Konf. s Uchastiem Zarubezhnykh Specialistov. Feodosiya, 2015:266—269. (in Russian).

12. Vorob'ev M.D., Kumov Ya.S., Yudaev D.N. Sozdanie Obraza Poverkhnosti s Emissionnymi Defektami na Osnove Izmereniya Nizkochastotnykh Shumov Otbiraemogo Toka. Sovremennye Tekhnologii v Nauke i Obrazovanii: Sb. Trudov Mezhdunar. Nauch.-tekhn. i Nauch.metod. Konf. 2017;1:266—269. (in Russian).
---
For citation: Vorobyev M.D., Yudaev D.N., Zorin A.Yu. Estimating the Quality of Thermionic Cathodes for Microwave Vacuum Tubes Using the Low-Frequency Noise Parameters. MPEI Vestnik. 2018;5:120—127. (in Russian). DOI: 10.24160/1993-6982-2018-5-120-127.

Published

2018-10-01

Issue

Section

Radio Engineering and Communications (05.12.00)